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Residual stresses in (Zr,Hf)N films (up to 11.9 at.% Hf) measured by X-ray diffraction using experimentally calculated XECs
E. Atar, C. Sarioglu, H. Cimenoglu, E.S. KayaliVolume:
191
Year:
2005
Language:
english
Pages:
7
DOI:
10.1016/j.surfcoat.2004.02.024
File:
PDF, 276 KB
english, 2005