An Improved X-Ray Image Plate Detector for Diffractometry

Thoms, M., Burzlaff, H., Kinne, A., Lange, J., von Seggern, H., Spengler, R., Winnacker, Albrecht

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Volume:

228-231

Year:

1996

Journal:

Materials Science Forum

DOI:

10.4028/www.scientific.net/MSF.228-231.107

File:

PDF, 549 KB

1996

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