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An Improved X-Ray Image Plate Detector for Diffractometry
Thoms, M., Burzlaff, H., Kinne, A., Lange, J., von Seggern, H., Spengler, R., Winnacker, AlbrechtVolume:
228-231
Year:
1996
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.228-231.107
File:
PDF, 549 KB
1996