Micro-Optical Characterization Study of Highly p-Type Doped SiC:Al Wafers
Wellmann, Peter J., Müller, Ralf, Pons, Michel, Thuaire, Aurelie, Crisci, Alexandre, Mermoux, Michel, Auvray, LaurentVolume:
483-485
Year:
2005
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.483-485.393
File:
PDF, 344 KB
english, 2005