Material characterization and nanohardness measurement of...

Material characterization and nanohardness measurement of nanostructured Ta–Si–N film

C.K. Chung, P.J. Su
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Volume:
188-189
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.surfcoat.2004.08.043
File:
PDF, 325 KB
english, 2004
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