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Evaluation of nanoparticles embedded in thin silicon dioxide film by optical reflection property
Nobutoshi Arai, Hiroshi Tsuji, Kazuya Ueno, Takuya Matsumoto, Yasuhito Gotoh, Kouichiro Adachi, Hiroshi Kotaki, Junzo IshikawaVolume:
196
Year:
2005
Language:
english
Pages:
6
DOI:
10.1016/j.surfcoat.2004.08.090
File:
PDF, 569 KB
english, 2005