Toughness measurement of thin films: a critical review

Toughness measurement of thin films: a critical review

Sam Zhang, Deen Sun, Yongqing Fu, Hejun Du
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Volume:
198
Year:
2005
Language:
english
Pages:
11
DOI:
10.1016/j.surfcoat.2004.10.021
File:
PDF, 646 KB
english, 2005
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