Periodic oscillations of thin film properties with their...

Periodic oscillations of thin film properties with their thickness for mixed real Bi2(M+N)Te3N phases

Martin Pavelka, Radek Zeipl, Miroslav Jelínek, Jarmila Walachová, Václav Studnička, Karel Jurek
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Volume:
200
Year:
2005
Language:
english
Pages:
3
DOI:
10.1016/j.surfcoat.2005.02.044
File:
PDF, 120 KB
english, 2005
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