Critical Thickness Threshold in HfO2 Layers
Besson, Pascal, Loup, Virginie, Salvetat, Thierry, Rochat, Névine, Lhostis, Sandrine, Favier, Sylvie, Dabertrand, Karen, Cosnier, VincentVolume:
134
Year:
2008
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.134.67
File:
PDF, 1.86 MB
english, 2008