Internal stress and adhesion of Cu film/Si prepared by both MEVVA and IBAD
Miao Yu, Jizhong Zhang, Dexing Li, Qingli Meng, Wenzhi LiVolume:
201
Year:
2006
Language:
english
Pages:
7
DOI:
10.1016/j.surfcoat.2006.01.047
File:
PDF, 510 KB
english, 2006