Output gating performance overhead elimination for scan...

International Journal of Electronics 2015 / 07 Vol. 102; Iss. 7

Output gating performance overhead elimination for scan test

Suhag, Ashok Kumar, Ahlawat, Satdev, Shrivastava, Vivek, Choudhary, Rahul Raj
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Volume:
102
Language:
english
Journal:
International Journal of Electronics
DOI:
10.1080/00207217.2014.977357
Date:
July, 2015
File:
PDF, 378 KB
english, 2015
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