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Properties of P(VDF-TeFE) thin film formed by annealing process with electric field
Jeong, Jong-Hyeon, Kimura, Chiharu, Aoki, Hidemitsu, Okuyama, Masanori, Sugino, TakashiVolume:
1218
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-1218-Z05-20
Date:
January, 2009
File:
PDF, 201 KB
english, 2009