X-ray diffraction analysis of the structure and residual...

Surface and Coatings Technology 2006 Vol. 201; Iss. 7

X-ray diffraction analysis of the structure and residual stresses of W/Cu multilayers

B. Girault, P. Villain, E. Le Bourhis, P. Goudeau, P.-O. Renault
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Volume:
201
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.surfcoat.2006.08.034
File:
PDF, 258 KB
english, 2006
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