Structural investigation of thin films of Ti1−xAlxN ternary...

Surface and Coatings Technology 2007 Vol. 201; Iss. 8

Structural investigation of thin films of Ti1−xAlxN ternary nitrides using Ti K-edge X-ray absorption fine structure

M.-H. Tuilier, M.-J. Pac, G. Covarel, C. Rousselot, L. Khouchaf
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Volume:
201
Year:
2007
Language:
english
Pages:
6
DOI:
10.1016/j.surfcoat.2006.09.095
File:
PDF, 465 KB
english, 2007
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