Detection of planar defects caused by ion irradiation in Si...

Detection of planar defects caused by ion irradiation in Si using molecular dynamics

S.T. Nakagawa, G. Betz, H.J. Whitlow
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Volume:
201
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.surfcoat.2006.09.332
File:
PDF, 373 KB
english, 2007
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