Refractive Indices of A-plane GaN Thin Films on R-plane Sapphire
Cai, Ailing, Wellenius, Ian Patrick, Gerhold, Mike, Muth, John, Osinsky, Andrei, Xie, J. Q., Dong, J. W.Volume:
892
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-0892-FF23-10
Date:
January, 2005
File:
PDF, 1.47 MB
english, 2005