Size and critical thickness evolution during growth of...

MRS Proceedings 2003 / 1 Vol. 794

Size and critical thickness evolution during growth of stacked layers of InAs/InP(001) quantum wires studied by in situ stress measurements

Fuster, David, González, María Ujué, González, Luisa, González, Yolanda, Ben, Teresa, Ponce, Arturo, Molina, Sergio I.
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Volume:
794
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-794-T5.3
Date:
January, 2003
File:
PDF, 555 KB
english, 2003
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