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Atom probe specimen preparation and 3D interfacial study of Ti–Al–N thin films
R. Rachbauer, S. Massl, E. Stergar, P. Felfer, P.H. MayrhoferVolume:
204
Year:
2010
Language:
english
Pages:
6
DOI:
10.1016/j.surfcoat.2009.11.020
File:
PDF, 4.79 MB
english, 2010