Atom probe specimen preparation and 3D interfacial study of...

Atom probe specimen preparation and 3D interfacial study of Ti–Al–N thin films

R. Rachbauer, S. Massl, E. Stergar, P. Felfer, P.H. Mayrhofer
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Volume:
204
Year:
2010
Language:
english
Pages:
6
DOI:
10.1016/j.surfcoat.2009.11.020
File:
PDF, 4.79 MB
english, 2010
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