Characterisation of residual stress and interface...

Characterisation of residual stress and interface degradation in TBCs by photo-luminescence piezo-spectroscopy

X. Wang, R.T. Wu, A. Atkinson
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Volume:
204
Year:
2010
Language:
english
Pages:
11
DOI:
10.1016/j.surfcoat.2010.01.035
File:
PDF, 1.18 MB
english, 2010
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