Quantification of void networks of as-sprayed and annealed...

Quantification of void networks of as-sprayed and annealed nanostructured yttria-stabilized zirconia (YSZ) deposits manufactured by suspension plasma spraying

Antoine Bacciochini, Fadhel Ben-Ettouil, Elodie Brousse, Jan Ilavsky, Ghislain Montavon, Alain Denoirjean, Stéphane Valette, Pierre Fauchais
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Volume:
205
Year:
2010
Language:
english
Pages:
7
DOI:
10.1016/j.surfcoat.2010.06.013
File:
PDF, 912 KB
english, 2010
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