Optical, Electrical and Lifetime Characterization of...

MRS Proceedings 2006 / 1 Vol. 911

Optical, Electrical and Lifetime Characterization of In-Grown Stacking Faults in 4H-SiC

Caldwell, Joshua David, Klein, Paul B, Glembocki, Orest J, Stahlbush, Robert E, Liu, Kendrick X, Hobart, Karl D, Kub, Fritz
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Volume:
911
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-0911-B03-05
Date:
January, 2006
File:
PDF, 3.28 MB
english, 2006
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