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A photoemission study of the Ooct-OPV5/SiO2/Si(1 1 1) interface: Effect of the SiO2 interlayer thickness
V. Papaefthimiou, A. Siokou, S. KennouVolume:
569
Year:
2004
Language:
english
Pages:
12
DOI:
10.1016/j.susc.2004.07.038
File:
PDF, 430 KB
english, 2004