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Measurement of the surface excitation probability of medium energy electrons reflected from Si, Ni, Ge and Ag surfaces
Wolfgang S.M. Werner, Lászlo Kövér, Sándor Egri, József Tóth, Desző VargaVolume:
585
Year:
2005
Language:
english
Pages:
10
DOI:
10.1016/j.susc.2005.04.018
File:
PDF, 216 KB
english, 2005