Quantitative Transmission Electron Microscopy Investigation of the Relaxation by Misfit Dislocations Confined at the Interface of GaN/Al 2 O 3 (0001)
Kaiser, Stephan, Preis, Herbert, Gebhardt, Wolfgang, Ambacher, Oliver, Angerer, Helmut, Stutzmann, Martin, Rosenauer, Andreas, Gerthsen, DagmarVolume:
37
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.37.84
Date:
January, 1998
File:
PDF, 2.09 MB
1998