Enhanced surface sensitivity in AES relative to XPS...

Surface Science 2005 Vol. 594; Iss. 1-3

Enhanced surface sensitivity in AES relative to XPS observed in free argon clusters

Marcus Lundwall, Maxim Tchaplyguine, Gunnar Öhrwall, Andreas Lindblad, Sergey Peredkov, Torbjörn Rander, Svante Svensson, Olle Björneholm
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Volume:
594
Year:
2005
Language:
english
Pages:
8
DOI:
10.1016/j.susc.2005.07.007
File:
PDF, 258 KB
english, 2005
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