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ECS Transactions [ECS China Semiconductor Technology International Conference 2010 (CSTIC 2010) - Shanghai, China (March 18 - March 19, 2010)] - The Combined Impact of Total Ionizing Dose Effect and Negative Bias Temperature Stress on Deep Sub-Micron pMOSFETs
Wang, Jian, Wang, Wenhua, Huang, Detao, Xue, Shoubin, Wang, Sihao, Liu, Wen, Huang, RuYear:
2010
Language:
english
DOI:
10.1149/1.3360596
File:
PDF, 269 KB
english, 2010