Morphology and defect structure of the...

Surface Science 2006 Vol. 600; Iss. 22

Morphology and defect structure of the CeO2(1 1 1) films grown on Ru(0 0 0 1) as studied by scanning tunneling microscopy

J.-L. Lu, H.-J. Gao, S. Shaikhutdinov, H.-J. Freund
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Volume:
600
Year:
2006
Language:
english
Pages:
7
DOI:
10.1016/j.susc.2006.08.023
File:
PDF, 3.42 MB
english, 2006
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