Structural study of Si(1 1 1)–6 × 1-Ag surface using surface X-ray diffraction
Kazushi Sumitani, Kosuke Masuzawa, Takashi Hoshino, Ryuji Yoshida, Sinichiro Nakatani, Toshio Takahashi, Hiroo Tajiri, Koichi Akimoto, Hiroshi Sugiyama, Xiao-Wei Zhang, Hiroshi KawataVolume:
601
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.susc.2007.04.252
File:
PDF, 285 KB
english, 2007