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Thickness dependence of the nanoscale piezoelectric properties measured by piezoresponse force microscopy on (1 1 1)-oriented PLZT 10/40/60 thin films
A. Ferri, S. Saitzek, A. Da Costa, R. Desfeux, G. Leclerc, R. Bouregba, G. PoullainVolume:
602
Year:
2008
Language:
english
Pages:
6
DOI:
10.1016/j.susc.2008.04.001
File:
PDF, 951 KB
english, 2008