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Applicability of magic angle for angle-resolved X-ray photoelectron spectroscopy of corrugated SiO2/Si surfaces: Monte Carlo calculations
K. Olejnik, J. ZemekVolume:
602
Year:
2008
Language:
english
Pages:
6
DOI:
10.1016/j.susc.2008.06.007
File:
PDF, 293 KB
english, 2008