X-Ray Texture Analysis in Films by the Reflection Method:...

X-Ray Texture Analysis in Films by the Reflection Method: Principal Aspects and Applications

Chateigner, Daniel, Germi, P., Pernet, M.
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Volume:
157-162
Year:
1994
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.157-162.1379
File:
PDF, 455 KB
1994
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