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Structure determination of three-dimensional hafnium silicide nano structures on Si(1 0 0) by means of X-ray photoelectron diffraction
C.R. Flüchter, A. de Siervo, D. Weier, M. Schürmann, A. Beimborn, S. Dreiner, M.F. Carazzolle, R. Landers, G.G. Kleiman, C. WestphalVolume:
602
Year:
2008
Language:
english
Pages:
7
DOI:
10.1016/j.susc.2008.09.033
File:
PDF, 627 KB
english, 2008