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[ECS 210th ECS Meeting - Cancun, Mexico (October 29-November 3, 2006)] ECS Transactions - Characterization of Strained Si/SiGe with Raman, Pulsed MOS Capacitor, and Gate Oxide Integrity Measurements
Liao, Jiun-Hsin, Canonico, Michael, Robinson, Mcdonald, Schroder, DieterVolume:
3
Year:
2006
Language:
english
DOI:
10.1149/1.2355916
File:
PDF, 900 KB
english, 2006