Application and Standard Error Analysis of the Parametric Methods for Predicting the Creep Life of Type 316LN SS
Kim, Woo Gon, Yoon, Song Nam, Ryu, Woo SeogVolume:
297-300
Year:
2005
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.297-300.2272
File:
PDF, 303 KB
english, 2005