![](/img/cover-not-exists.png)
Nanoscale dislocation patterning in Bi(1 1 1)/Si(0 0 1) heteroepitaxy
G. Jnawali, H. Hattab, C.A. Bobisch, A. Bernhart, E. Zubkov, R. Möller, M. Horn-von HoegenVolume:
603
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.susc.2009.03.027
File:
PDF, 561 KB
english, 2009