Identification of iron oxide phases in thin films grown on Al2O3(0 0 0 1) by Raman spectroscopy and X-ray diffraction
Maike Lübbe, Alexander M. Gigler, Robert W. Stark, Wolfgang MoritzVolume:
604
Year:
2010
Language:
english
Pages:
7
DOI:
10.1016/j.susc.2010.01.015
File:
PDF, 436 KB
english, 2010