Measuring grain boundary segregation using Wavelength...

Surface Science 2011 Vol. 605; Iss. 7-8

Measuring grain boundary segregation using Wavelength Dispersive X-ray Spectroscopy: Further developments

P. Nowakowski, F. Christien, M. Allart, Y. Borjon-Piron, R. Le Gall
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Volume:
605
Year:
2011
Language:
english
Pages:
11
DOI:
10.1016/j.susc.2011.01.032
File:
PDF, 1023 KB
english, 2011
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