Quantifying transient states in materials with the dynamic...

Quantifying transient states in materials with the dynamic transmission electron microscope

Campbell, G. H., LaGrange, T., Kim, J. S., Reed, B. W., Browning, N. D.
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Volume:
59
Language:
english
Journal:
Journal of Electron Microscopy
DOI:
10.1093/jmicro/dfq032
Date:
August, 2010
File:
PDF, 4.22 MB
english, 2010
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