Quantifying transient states in materials with the dynamic transmission electron microscope
Campbell, G. H., LaGrange, T., Kim, J. S., Reed, B. W., Browning, N. D.Volume:
59
Language:
english
Journal:
Journal of Electron Microscopy
DOI:
10.1093/jmicro/dfq032
Date:
August, 2010
File:
PDF, 4.22 MB
english, 2010