Impact of the Back-Gate Biasing on Trigate MOSFET Electron...

IEEE Transactions on Electron Devices 2015 / 1 Vol. 62; Iss. 1

Impact of the Back-Gate Biasing on Trigate MOSFET Electron Mobility

Marin, Enrique G., Ruiz, Francisco G., Godoy, Andres, Tienda-Luna, Isabel Maria, Martinez-Blanque, Celso, Gamiz, Francisco
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2014.2367574
Date:
January, 2015
File:
PDF, 930 KB
english, 2015
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