In situ three-dimensional X-ray reciprocal-space mapping of...

In situ three-dimensional X-ray reciprocal-space mapping of InGaAs multilayer structures grown on GaAs(001) by MBE

Sasaki, Takuo, Takahasi, Masamitu, Suzuki, Hidetoshi, Ohshita, Yoshio, Yamaguchi, Masafumi
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Volume:
425
Language:
english
Journal:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2015.03.044
Date:
September, 2015
File:
PDF, 1.43 MB
english, 2015
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