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SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2009 - Beijing, China (Wednesday 17 June 2009)] International Symposium on Photoelectronic Detection and Imaging 2009: Material and Device Technology for Sensors - Structural and electrical properties of delafossite CuMO2 (M=Al, Cr, Y) semiconductors and their exploitation for ozone detection
Deng, Zanhong, Fang, Xiaodong, Li, Da, Tao, Ruhua, Dong, Weiwei, Wang, Tao, Zhou, Shu, Meng, Gang, Zhu, Xuebin, Chen, Xu-yuan, Wang, Yue-lin, Zhou, Zhi-ping, Wang, Qing-kangVolume:
7381
Year:
2009
Language:
english
DOI:
10.1117/12.835093
File:
PDF, 363 KB
english, 2009