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SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2005 - San Jose, CA (Saturday 22 January 2005)] Light-Emitting Diodes: Research, Manufacturing, and Applications IX - Junction temperature in light-emitting diodes assessed by different methods
Chhajed, Sameer, Xi, Yangang, Gessmann, Thomas, Xi, Jing-Qun, Shah, Jay M., Kim, Jong Kyu, Schubert, E. Fred, Stockman, Steve A., Yao, H. Walter, Schubert, E. FredVolume:
5739
Year:
2005
Language:
english
DOI:
10.1117/12.593696
File:
PDF, 2.14 MB
english, 2005