SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Developments in X-Ray Tomography III - Quantitative analysis of three-dimensional x-ray tomographic images
Lindquist, W. Brent, Bonse, UlrichVolume:
4503
Year:
2002
Language:
english
DOI:
10.1117/12.452833
File:
PDF, 624 KB
english, 2002