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ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - (Invited) Tip Cleaning and Sample Design for High Resolution MOSCAP x-KPFM
Melitz, Willhem, Shen, Jian, Lee, S., Lee, J.S., Royer, J.E., Bentley, Steven, Macintyre, Douglas, Holland, Martin, Thayne, Iain, Kummel, Andrew C.Year:
2010
Language:
english
DOI:
10.1149/1.3481596
File:
PDF, 879 KB
english, 2010