Diffusion Properties of Ion-Implanted Vanadium in PECVD-SiO[sub 2] and PECVD-SiN[sub x]
Isenberg, J., Reber, S., Warta, W.Volume:
150
Year:
2003
Language:
english
Journal:
Journal of The Electrochemical Society
DOI:
10.1149/1.1575741
File:
PDF, 159 KB
english, 2003