On a New Method Based on X-Ray Diffraction to Identify...

Materials Science Forum 2006 Vol. 514-516

On a New Method Based on X-Ray Diffraction to Identify Stress-Strain Laws on Surface-Treated Materials

Batista, A.C., Nobre, Joao P., Dias, A. Morão
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Volume:
514-516
Year:
2006
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.514-516.1623
File:
PDF, 1.53 MB
english, 2006
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