Automatic nanohandling station inside a scanning electron...

ARCHIVE Proceedings of the Institution of Mechanical Engineers Part B Journal of Engineering Manufacture 1989-1996 (vols 203-210) 2008 / 1 Vol. 222; Iss. 1

Automatic nanohandling station inside a scanning electron microscope

Fatikow, S, Wich, T, Sievers, T, Jähnisch, M, Eichhorn, V, Mircea, J, Hülsen, H, Stolle, Ch
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
222
Language:
english
Journal:
Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture
DOI:
10.1243/09544054JEM836
Date:
January, 2008
File:
PDF, 771 KB
english, 2008
Conversion to is in progress
Conversion to is failed