High Electrical Activation of Aluminium and Nitrogen Implanted in 6H-SiC at Room Temperature by RF Annealing
Lazar, Mihaï, Ottaviani, Laurent, Locatelli, Marie Laure, Raynaud, Christophe, Planson, Dominique, Morvan, Erwan, Godignon, Phillippe, Skorupa, Wolfgang, Chante, Jean-PierreVolume:
353-356
Year:
2001
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.353-356.571
File:
PDF, 446 KB
2001