Effect of defect size on defect depth quantification in...

Measurement Science and Technology 2013 / 12 Vol. 24; Iss. 12

Effect of defect size on defect depth quantification in pulsed thermography

Sharath, D, Menaka, M, Venkatraman, B
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Volume:
24
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/24/12/125205
Date:
December, 2013
File:
PDF, 879 KB
english, 2013
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