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Evolution of Basal Plane Dislocations during 4H-SiC Epitaxial Growth
Stahlbush, Robert E., VanMil, Brenda L., Liu, Kendrick X., Lew, Kok Keong, Myers Ward, Rachael L., Gaskill, D. Kurt, Eddy Jr., Charles R., Zhang, X., Skowronski, MarekVolume:
600-603
Year:
2009
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.600-603.317
File:
PDF, 1.60 MB
english, 2009