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HVPE GaN with Low Concentration of Point Defects for Power Electronics
Reshchikov, M. A., McNamara, J.D., Usikov, A., Helava, H., Makarov, Yu.Volume:
1736
Year:
2015
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/opl.2015.140
File:
PDF, 998 KB
english, 2015